Andrej Rumiantsev received the Diploma-Engineer degree (with highest honors) in Telecommunication systems from the Belarusian State University of Informatics and Radio Electronics (BSUIR), Minsk, Belarus, and the Dr.-Ing. Degree (with summa cum laude) in Electrical Engineering from Brandenburg University of Technology (BTU) Cottbus, Germany, in 1994 and 2014, respectively.
From 1997 to 2001, he served as a research and teaching assistant in the Department of Telecommunication Systems at the BSUIR. From 2001 to 2013, he held various engineering and engineering management positions at SUSS MicroTec Test Systems (from January 2010 Cascade Microtech). He significantly contributed to the development of the SUSS’ RF wafer probe, the |Z| Probe, wafer-level calibration standards, calibration software and probe systems. At Cascade Microtech, he held the position of Product Marketing Manager of Device Characterization for Modeling and Process Development. In 2013, he joined Ulrich L. Rohde Chair for RF and Microwave Techniques at Brandenburg University of Technologies (BTU), Cottbus, Germany. Dr. Rumiantsev is currently with MPI Corporation, holding a position of Director of RF Technologies of the Advanced Semiconductor Test Division. His research interests include RF calibration and wafer-level measurement techniques for advanced semiconductor devices.
Dr. Rumiantsev is a member of the IEEE MTT-S, ARFTG from 2004 as well as the IEEE MTT-11 Microwave Measurements Committee. He serves as the Chair of the Modeling and Simulation Sub-Committee and ExCom member of IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM). He is an active publishing author and reviewer at various MTT-S conferences and journals. He holds several patents in the area of wafer-level RF calibration and measurements techniques. Dr. Rumiantsev received the ARFTG-71th Best Interactive Forum Paper Award. His doctoral thesis was awarded as “Best Dissertation of 2014 at Brandenburg University of Technologies”.