Speakers Bureau

Metrology Developments for Future Wireless Technologies

Prof. Nuno Borges Carvalho

former-ChairInstituto de Telecomunicacoes, Universidade de Aveiro, Aveiro, 3810-193, Portugal

Tel: +351 234-377-900

Emerging Wireless Technologies have an impact on nowadays microwave characterization technologies, the change in paradigm from analog to digital and from RF to DC, has a strong impact in the way nonlinear microwave characterization is seen. In this talk a general overview of these technologies...

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Multiport Vector Network Analyzer: From the beginning to modern signal integrity applications

Prof. Andrea Ferrero

Vice-Chair Keysight, 1400 Fountaingrove Parkway, Santa Rosa, CA, 95403, USA

With the recent digital systems and circuits outstanding increase in speed and complexity, multiport characterization at microwaves and millimeter waves is experiencing an impressive growth in demand and importance. Today the application of multiport techniques is shifting from typical microwave...

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Microwave fiber-optic links: Design and measurement issues

Stavros Iezekiel

Department of Electrical and Computer Engineering, University of Cyprus, 75 Kallipoleos Avenue, P.O. Box 20537, Nicosia, 1678, Cyprus

Tel: + 357 22892190

Optical fibre is an excellent transmission medium - it has very low loss and very large bandwidth (especially when compared with microwave transmission media). In addition, it is possible to modulate light at several tens of GHz and then recover that modulation. Hence there has been much...

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High-Frequency Measurements of Dielectric Substrate Materials

Michael D. Janezic

MemberElectromagnetic Properties of Materials Project, National Institute of Standards and Technology, 325 Broadway MS 818.01F, Boulder, CO 80305, USA

Tel: +1 303 497 3656

Material manufacturers are developing new, high-performance substrate materials in order to meet the specifications of new applications that operate over wider and wider frequencies. In order for engineers to select the most appropriate material to incorporate into microwave devices, the...

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Evaluating errors and uncertainties in RF & microwave measurements

Dr. Nick Ridler

Member and Past Chair National Physical Laboratory, Hampton Road Teddington Middlesex, TW11 0LW, United Kingdom

Tel: +44 208 943 7116

This talk gives an overview of the principles and processes involved in dealing with errors in measurements, particularly at RF and microwave frequencies. The talk shows how the concept of uncertainty can be used to quantify the effects of errors that occur during measurements. The methods used...

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All you need to know about RF and microwave coax connectors but were afraid to ask

Dr. Nick Ridler

Member and Past Chair National Physical Laboratory, Hampton Road Teddington Middlesex, TW11 0LW, United Kingdom

Tel: +44 208 943 7116

The humble coaxial connector has been a regular player in the high frequency electronics industry for the past fifty years or more. But it is this apparent familiarity, and apparent simplicity, that often leads to misunderstandings and mistakes with the use of connectors. This talk will give a...

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RF I-V Waveform Measurement and Engineering - the unifying link between transistor technology, circuit design and system performance

Professor Paul Tasker

Cardiff University, Cardiff, UK CF24 3AA, U.K. Cardiff University and Agilent Technology Centre for High Frequency Engineering,

Tel: +44-29-2087-4423 (w)

Fax: +44-0-29-2087-4939

Microwave power amplifier performance, output power, conversion efficiency and linearity, etc., is significantly influenced by the terminal voltage and current time varying waveforms that develop at the transistor terminals; terminal waveforms are the unifying theoretical link between transistor...

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