Dylan F. Williams (M’80–SM’90–F’02) received the Ph.D. degree in electrical engineering from the University of California, Berkeley, in 1986.
He joined the Electromagnetic Fields Division of the National Institute of Standards and Technology, Boulder, CO, in 1989, where he develops metrology for the characterization of monolithic microwave integrated circuits and electronic interconnects. He has published over 80 technical papers.
Dr. Williams is the recipient of the Department of Commerce Bronze and Silver Medals, two Electrical Engineering Laboratory’s Outstanding Paper Awards, two Automatic RF Techniques Group (ARFTG) Best Paper Awards, the ARFTG Automated Measurements Technology Award, and the IEEE Morris E. Leeds Award. He also served a four-year term as Editor-in-Chief of the IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES.